Citation: Yong-Juan Lu, Jun-Hong Jia. The effect of complexing agent on crystal growth, structure and properties of nanostructured Cu2-xS thin films[J]. Chinese Chemical Letters, ;2014, 25(11): 1473-1478. doi: 10.1016/j.cclet.2014.06.003 shu

The effect of complexing agent on crystal growth, structure and properties of nanostructured Cu2-xS thin films

  • Corresponding author: Yong-Juan Lu,  Jun-Hong Jia, 
  • Received Date: 8 April 2014
    Available Online: 28 May 2014

  • Thin films of Cu2-xS (x=0, 1) were deposited on self-assembled, monolayer modified substrates in the copper-thiosulfate system with various concentrations of ethylene diamine tetraacetic acid (EDTA) at a low temperature of 70℃. The thin films were characterized by means of X-ray diffraction (XRD), X-ray photoelectron spectroscope (XPS), field emission scanning electron microscopy (FESEM), transmission electron microscopy (TEM). The optical and photoelectrochemical (PEC) properties of the Cu2-xS semiconductor films were investigated by ultraviolet-visible (UV-vis) absorption spectroscopy and a three-electrode system. It is found that EDTA plays a key role in the process of Cu2-xS nanocrystals formation and growth. The compositions of the Cu2-xS nanocrystals varied from Cu2S (chalcocide) to CuS (covellite) through adjusting the concentration of EDTA, which is used as a complexing agent to yield high-quality Cu2-xS films. The growth mechanisms of Cu2-xS nanocrystals with different EDTA concentrations are proposed and discussed in detail.
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